MULTI-PURPOSE AUTOMATED X-RAY DIFFRACTOMETER WITH HORIZONTAL SPECIMEN ORIENTATION

B.M. Alaudinov, V.E. Asadchikov, I.V. Kozhevnikov^*, B.V. Mchedlishvili, V.A. Shishkov

A.V. Shubnikov Institute of Crystallography, RAS, Moscow, Russia
^*Physical Institute RAS, Moscow, Russia

A new design of the multi-purpose X-ray diffractometer with horizontal specimen orientation. The reliability of the instrument during long experiments for supersmooth surface studies is shown. In particular, application of the diffractometer for measurement of the transition layer thicknen in the units of Angstrom range to an accuracy of a fraction of Angstrom is demonstrated.