ON THE NEW POTENTIALS OF
ELLIPSOMETRY ARISING
FROM THE NULL OPTICAL CIRCUIT.
ELLIPSOMETRY OF REAL SURFACE STRUCTURES.
4. INVESTIGATION OF RELATIVELY THICK TRANSPARENT
FILMS AND DISRUPTED SURFACE LAYERS
ON TRANSPARENT MATERIALS
A. I. Semenenko, I. A. Semenenko*
Institute of Applied Physics NAS, Ukraine, Sumy
*Institute for Analytical Instrumentation RAS, Saint-Petersburg
A new ellipsometric approach to investigation
of thick (relative to thickness periods of the polarization angles PSI and
DELTA) transparent films has been developed. The method was tested on silicon-polymer
sample) as well as on disrupted surface layers on sapphire and optical glasses
K-8. Conceptually new results were obtained.