M. I. Yavor, A. N. Verenchikov
Institute for Analytical Instrumentation RAS, Saint-Petersburg
The paper presents the design of
a multireflection time-of-flight mass analyzer wherein the ions are successively
reflected from two parallel two-dimensional gridless electrostatic mirrors.
The spatial confinement of an ion beam at numerous reflections and time
focusing in a wide range of energies are achieved due to optimization of
the field distribution at the mirrors. The analyzer is suitable for operation
both in the high mass resolution mode and in the time-of-flight "slow"
ion separation mode in tandem spectrometers.