A. S. Berdnikov, L. N. Gall, V. D. Sachenko, Yu. I. Khasin,
A. V. Saprygin*, V A. Kalashnikov*, Yu. N. Zalesov*, A. B. Maleev*
Institute for Analytical Instrumentation RAS, Saint-Petersburg
Hardware and software methods for
simulation of general-purpose ion-optical devices and ion sources for mass
spectrometers are considered. A review of available methods is represented
and description of commercially available software is included. Special
emphasis is on the SIMION 3D program (version 7.0) for which the steps
of a specific simulation procedure are described. In addition dedicated
pre- and postprocessoring software modules enabling one to specify easily
initial SIMION beam conditions and to represent in clear graphical form
SIMION output information are considered.