SIMULATION  METHODS  AND  SOFTWARE 
FOR  DEVELOPMENT OF  ION  SOURCE 
ION-OPTICAL  SYSTEMS  USED

IN  MASS  SPECTROMETERS

A. S. Berdnikov, L. N. Gall, V. D. Sachenko, Yu. I. Khasin,
A. V. Saprygin*, V A. Kalashnikov*, Yu. N. Zalesov*, A. B. Maleev*

                  Institute for Analytical Instrumentation RAS, Saint-Petersburg

*Industrial Electrochemical Complex, Novouralsk

  Hardware and software methods for simulation of general-purpose ion-optical devices and ion sources for mass spectrometers are considered. A review of available methods is represented and description of commercially available software is included. Special emphasis is on the SIMION 3D program (version 7.0) for which the steps of a specific simulation procedure are described. In addition dedicated pre- and postprocessoring software modules enabling one to specify easily initial SIMION beam conditions and to represent in clear graphical form SIMION output information are considered.