A  PROCEDURE  FOR  MUTUAL  ADJUSTMENT
OF  THE  ION  SOURCE  AND  ANALYZER
IN  THE  STATIC  MASS SPECTROMETER


A. S. Berdnikov, L. N. Gall, J. I. Khasin

Institute for Analytical Instrumentation RAS, Saint-Petersburg


  This paper describes a procedure for mutual adjustment of ion source parameters and the optical scheme of a magnetic mass spectrometer. The optical schemes of the ion source and the static mass analyzer are considered as a single part and the movement of the ion beam particles is considered as the evolution of a 6-dimensional phase space region. Electrostatic and magnetic fields, as well as the ion trajectories, are simulated by SIMION 3D (version 7.0). Special sub-modules enable one to simulate the beam initial conditions and to represent the SIMION output data in terms of phase space. (These modules interact with the user via phase space language, communicate with SIMION, using its input and output files, allow one to view the beam phase space characteristics as user-friendly pictures.) The procedure is used to optimize the ion source for the mass spectrometer MSD650. Experimental results of mutual adjustment of the ion beam characteristics and the mass spectrometer "transparency" are presented.