SELECTION  AND  OPTIMIZATION  
OF  THE  SPECTROPHOTOMETER  STRUCTURAL  SCHEME  
FOR  DIFFUSE  REFLECTANCE  MEASUREMENTS

(PART 1)
 

E. V. Kuvaldin

Vavilov State Optical Institute, Saint-Petersburg

 
   The described method of optimization consists of two parts. The first part is devoted to selection of the optical schematic providing minimal losses, the second one presents the methods for optimization of the receiving path, electric measuring circuit and also for minimization of measurement error. The main problems and the ways of their solving are discussed.